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Results: 1
Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
Authors:
Palau, JM Hubert, G Coulie, K Sagnes, B Calvet, MC Fourtine, S
Citation:
Jm. Palau et al., Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions, IEEE NUCL S, 48(2), 2001, pp. 225-231
Risultati:
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