Authors: Wark, AW Berlouis, LEA Cruickshank, FK Pugh, D Brevet, PF

Citation: Aw. Wark et al., In-situ evaluation of the anodic oxide growth on Hg1-xCdxTe (MCT) using ellipsometry and second harmonic generation, J ELEC MAT, 29(6), 2000, pp. 648-653