Authors:
Yu, WX
Cui, SF
Li, JH
Wu, LS
Mai, ZH
Liu, BT
Zhao, BR
Zheng, WL
Jia, QJ
Citation: Wx. Yu et al., Study of the microstructures and the strain of PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 integrated films, PHYSICA C, 337(1-4), 2000, pp. 39-43
Authors:
Yu, WX
Cui, SF
Li, JH
Wu, LS
Mai, ZH
Liu, BT
Zhao, BR
Zheng, WL
Jia, QJ
Citation: Wx. Yu et al., Surface roughness exponent and non-designed cap layer in PbZr0.53Ti0.47O3/La1.85Sr0.15CuO4 bilayers, J PHYS D, 33(19), 2000, pp. 2363-2368
Authors:
Yu, WX
Cui, SF
Wu, LS
Mai, ZH
Li, CL
Cui, DF
Chen, ZH
Citation: Wx. Yu et al., The structure of BaTiO3 and BaTiO3-YBa2Cu3O7-delta thin films studied by X-ray triple-axis diffraction, MOD PHY L B, 13(12-13), 1999, pp. 441-450
Authors:
Li, JH
Chen, H
Cai, LC
Cui, SF
Yu, WX
Zhou, JM
Huang, Q
Mai, ZH
Zheng, WL
Jia, QJ
Citation: Jh. Li et al., Interfacial structure of molecular beam epitaxial grown cubic-GaN films onGaAs(001) probed by x-ray gazing-angle specular reflection, APPL PHYS L, 74(20), 1999, pp. 2981-2983