Authors: Czaske, M

Citation: M. Czaske, Measuring submicrometer structures near the limit of resolution of opticalmicroscopy, TEC MES, 66(2), 1999, pp. 43-49

Authors: Buhr, E Czaske, M

Citation: E. Buhr et M. Czaske, Sensitometer for quality assurance in X-ray diagnosis, PTB-MITT, 108(5), 1998, pp. 400-401