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Results:
1-7
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Results: 7
Authors:
DAROWSKI N
PASCHKE K
PIETSCH U
WANG K
FORCHEL A
LUBBERT D
BAUMBACH T
Citation: N. Darowski et al., STRUCTURAL CHARACTERIZATION OF A GAAS SURFACE WIRE STRUCTURE BY TRIPLE AXIS X-RAY GRAZING-INCIDENCE DIFFRACTION, Physica. B, Condensed matter, 248, 1998, pp. 104-108
Authors:
BAUMBACH GT
LUBBERT D
PIETSCH U
DAROWSKI N
LEPRINCE L
TALNEAU A
SCHNECK J
Citation: Gt. Baumbach et al., GRAZING-INCIDENCE DIFFRACTION BY EPITAXIAL MULTILAYERED GRATINGS, Physica. B, Condensed matter, 248, 1998, pp. 343-348
Authors:
HOLY V
DARHUBER AA
STANGL J
ZERLAUTH S
SCHAFFLER F
BAUER G
DAROWSKI N
LUBBERT D
PIETSCH U
VAVRA I
Citation: V. Holy et al., COPLANAR AND GRAZING-INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM-DOT MULTILAYERS, Physical review. B, Condensed matter, 58(12), 1998, pp. 7934-7943
Authors:
DAROWSKI N
PIETSCH U
ZEIMER U
SMIRNITZKI V
BUGGE F
Citation: N. Darowski et al., X-RAY STUDY OF LATERAL STRAIN AND COMPOSITION MODULATION IN AN ALGAASOVERLAYER INDUCED BY A GAAS LATERAL SURFACE GRATING, Journal of applied physics, 84(3), 1998, pp. 1366-1370
Authors:
DAROWSKI N
PIETSCH U
ZHUANG Y
ZERLAUTH S
BAUER G
LUBBERT D
BAUMBACH T
Citation: N. Darowski et al., INPLANE STRAIN AND STRAIN RELAXATION IN LATERALLY PATTERNED PERIODIC ARRAYS OF SI SIGE QUANTUM WIRES AND DOT ARRAYS/, Applied physics letters, 73(6), 1998, pp. 806-808
Authors:
SCHULZ D
WOLLWEBER J
DAROWSKI N
SCHRODER W
Citation: D. Schulz et al., AXIAL TEMPERATURE DISTRIBUTION IN SILICON-GERMANIUM GROWN BY THE RF-HEATED FLOAT-ZONE TECHNIQUE, Crystal research and technology, 32(1), 1997, pp. 61-68
Authors:
DAROWSKI N
PASCHKE K
PIETSCH U
WANG KH
FORCHEL A
BAUMBACH T
ZEIMER U
Citation: N. Darowski et al., IDENTIFICATION OF A BURIED SINGLE-QUANTUM-WELL WITHIN SURFACE STRUCTURED SEMICONDUCTORS USING DEPTH RESOLVED X-RAY GRAZING-INCIDENCE DIFFRACTION, Journal of physics. D, Applied physics, 30(16), 1997, pp. 55-59
Risultati:
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