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Results:
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Results: 10
Authors:
DAVAZOGLOU D
VASILOPOULOU MA
ARGITIS P
Citation: D. Davazoglou et al., OPTICAL CHARACTERIZATION OF THIN ORGANIC FILMS BY ANALYZING TRANSMISSION MEASUREMENTS WITH THE FOROUHI-BLOOMER MODEL, Microelectronic engineering, 42, 1998, pp. 619-622
Authors:
CHRYSICOPOULOU P
DAVAZOGLOU D
TRAPALIS C
KORDAS G
Citation: P. Chrysicopoulou et al., OPTICAL-PROPERTIES OF VERY THIN (LESS-THAN-100NM) SOL-GEL TIO2 FILMS, Thin solid films, 323(1-2), 1998, pp. 188-193
Authors:
VAMVAKAS VE
DAVAZOGLOU D
VAHLAS C
Citation: Ve. Vamvakas et al., THERMODYNAMIC STUDY, COMPOSITIONAL AND ELECTRICAL CHARACTERIZATION OFLPCVD SIO2-FILMS GROWN FROM TEOS N2O MIXTURES/, Microelectronics and reliability, 38(2), 1998, pp. 265-269
Authors:
DAVAZOGLOU D
VAMVAKAS VE
VAHLAS C
Citation: D. Davazoglou et al., THERMODYNAMIC STUDY, COMPOSITION, AND MICROSTRUCTURE OF LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED SILICON DIOXIDE FILMS GROWN FROM TEOS N2O MIXTURES/, Journal of the Electrochemical Society, 145(4), 1998, pp. 1310-1317
Authors:
DAVAZOGLOU D
GEORGOULEAS K
Citation: D. Davazoglou et K. Georgouleas, LOW-PRESSURE CHEMICALLY VAPOR-DEPOSITED WO3 THIN-FILMS FOR INTEGRATEDGAS SENSOR APPLICATIONS, Journal of the Electrochemical Society, 145(4), 1998, pp. 1346-1350
Authors:
DAVAZOGLOU D
Citation: D. Davazoglou, OPTICAL-PROPERTIES OF SNO2 THIN-FILMS GROWN BY ATMOSPHERIC-PRESSURE CHEMICAL-VAPOR-DEPOSITION OXIDIZING SNCL4, Thin solid films, 302(1-2), 1997, pp. 204-213
Authors:
DAVAZOGLOU D
MOUTSAKIS A
VALAMONTES V
PSYCHARIS V
TSAMAKIS D
Citation: D. Davazoglou et al., TUNGSTEN-OXIDE THIN-FILMS CHEMICALLY VAPOR-DEPOSITED AT LOW-PRESSURE BY W(CO)(6) PYROLYSIS, Journal of the Electrochemical Society, 144(2), 1997, pp. 595-599
Authors:
DAVAZOGLOU D
Citation: D. Davazoglou, DETERMINATION OF OPTICAL DISPERSION AND FILM THICKNESS OF SEMICONDUCTING DISORDERED LAYERS BY TRANSMISSION MEASUREMENTS - APPLICATION FOR CHEMICALLY VAPOR-DEPOSITED SI AND SNO2 FILM, Applied physics letters, 70(2), 1997, pp. 246-248
Authors:
DAVAZOGLOU D
PALLIS G
PSYCHARIS V
GIOTI M
LOGOTHETIDIS S
Citation: D. Davazoglou et al., STRUCTURE AND OPTICAL-PROPERTIES OF TUNGSTEN THIN-FILMS DEPOSITED BY PYROLYSIS OF W(CO)(6) AT VARIOUS TEMPERATURES, Journal of applied physics, 77(11), 1995, pp. 6070-6072
Authors:
DAVAZOGLOU D
DONNADIEU A
Citation: D. Davazoglou et A. Donnadieu, OPTICAL OSCILLATOR-STRENGTHS AND QUANTUM-MECHANICS MATRIX-ELEMENTS OFWO(3) POLYCRYSTALLINE THIN-FILMS, Journal of non-crystalline solids, 169(1-2), 1994, pp. 64-71
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