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Results:
1-7
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Results: 7
Authors:
DAVIES ST
MIYAMOTO I
Citation: St. Davies et I. Miyamoto, SPECIAL ISSUE FEATURING PAPERS FROM THE 5TH JOINT TOKYO-WARWICK-BIENNIAL-NANOTECHNOLOGY-SYMPOSIUM, Nanotechnology, 9(2), 1998, pp. 3-3
Authors:
TSUCHIYA K
DAVIES ST
Citation: K. Tsuchiya et St. Davies, FABRICATION OF TINI SHAPE-MEMORY ALLOY MICROACTUATORS BY ION-BEAM SPUTTER-DEPOSITION, Nanotechnology, 9(2), 1998, pp. 67-71
Authors:
KHAMESEHPOUR B
DAVIES ST
Citation: B. Khamesehpour et St. Davies, FOCUSED ION-BEAM PREPARATION OF INCLINED PLANES IN SEMICONDUCTOR-MATERIALS, Vacuum, 47(5), 1996, pp. 451-454
Authors:
DAVIES ST
KHAMSEHPOUR B
Citation: St. Davies et B. Khamsehpour, FOCUSED ION-BEAM MACHINING AND DEPOSITION FOR NANOFABRICATION, Vacuum, 47(5), 1996, pp. 455-462
Authors:
KHAMSEHPOUR B
DAVIES ST
Citation: B. Khamsehpour et St. Davies, ANGLE LAPPING OF MULTILAYER STRUCTURES FOR THICKNESS MEASUREMENTS USING FOCUSED ION-BEAM MICROMACHINING, Semiconductor science and technology, 9(3), 1994, pp. 249-255
Authors:
KHAMSEHPOUR B
DAVIES ST
Citation: B. Khamsehpour et St. Davies, MICROMACHINING OF SEMICONDUCTOR-MATERIALS BY FOCUSED ION-BEAMS, Vacuum, 45(12), 1994, pp. 1169-1173
Authors:
DAVIES ST
KHAMSEHPOUR B
Citation: St. Davies et B. Khamsehpour, END-POINT DETECTION USING ABSORBED CURRENT, SECONDARY-ELECTRON, AND SECONDARY ION SIGNALS DURING MILLING OF MULTILAYER STRUCTURES BY FOCUSED ION-BEAM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 263-267
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