Authors: DELAET J DEBOECIK K TERRYN H VEREECKEN J

Citation: J. Delaet et al., DETERMINATION OF THE DEPTH RESOLUTION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF ANODIC BARRIER OXIDE-FILMS ON DIFFERENTLY PRETREATEDALUMINUM SUBSTRATES, Surface and interface analysis, 22(1-12), 1994, pp. 175-180