Authors: KOSIER SL WEI A SCHRIMPF RD FLEETWOOD DM DELAUS MD COMBS WE

Citation: Sl. Kosier et al., PHYSICALLY-BASED COMPARISON OF HOT-CARRIER-INDUCED AND IONIZING-RADIATION-INDUCED DEGRADATION IN BJTS, I.E.E.E. transactions on electron devices, 42(3), 1995, pp. 436-444