Authors: DEVEY ME DELFINOMIX A KINLOCH BB NEALE DB

Citation: Me. Devey et al., RANDOM AMPLIFIED POLYMORPHIC DNA MARKERS TIGHTLY LINKED TO A GENE FORRESISTANCE TO WHITE-PINE BLISTER RUST IN SUGAR PINE, Proceedings of the National Academy of Sciences of the United Statesof America, 92(6), 1995, pp. 2066-2070