Authors: KILDEMO M DENIAU S BULKIN P DREVILLON B

Citation: M. Kildemo et al., REAL-TIME CONTROL OF THE GROWTH OF SILICON ALLOY MULTILAYERS BY MULTIWAVELENGTH ELLIPSOMETRY, Thin solid films, 291, 1996, pp. 46-50

Authors: SYKES C ANDRIEU C DETAPPE V DENIAU S

Citation: C. Sykes et al., CRITICAL RADIUS OF HOLES IN LIQUID COATING, Journal de physique. III, 4(4), 1994, pp. 775-781