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Authors: DEVASCONCELOS EA DASILVA EF

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Authors: DEVASCONCELOS EA DASILVA EF

Citation: Ea. Devasconcelos et Ef. Dasilva, CORRELATION BETWEEN DOPANT REDUCTION AND INTERFACIAL DEFECTS IN LOW-ENERGY X-RAY-IRRADIATED MOS CAPACITORS, Semiconductor science and technology, 12(8), 1997, pp. 1032-1037