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Citation: Na. Dumin et al., CORRELATION OF THE DECAY OF TUNNELING CURRENTS WITH TRAP GENERATION INSIDE THIN OXIDES, Solid-state electronics, 39(5), 1996, pp. 655-660

Authors: DUMIN DJ MADDUX JR SUBRAMONIAM R SCOTT RS VANCHINATHAN S DUMIN NA DICKERSON KJ MOPURI S GLADSTONE SM HUGHES TW

Citation: Dj. Dumin et al., CHARACTERIZING WEAROUT, BREAKDOWN, AND TRAP GENERATION IN THIN SILICON-OXIDE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1780-1787