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Results: 1-25 | 26-28 |
Results: 26-28/28
LOW-TEMPERATURE CHEMICAL BEAM EPITAXY OF GALLIUM PHOSPHIDE SILICON HETEROSTRUCTURES/
Authors: KELLIHER JT THORNTON J DIETZ N LUCOVSKY G BACHMANN KJ
Citation: Jt. Kelliher et al., LOW-TEMPERATURE CHEMICAL BEAM EPITAXY OF GALLIUM PHOSPHIDE SILICON HETEROSTRUCTURES/, Materials science & engineering. B, Solid-state materials for advanced technology, 22(1), 1993, pp. 97-102
AN OPTICAL INSITU METHOD FOR LAYER GROWTH-CHARACTERIZATION
Authors: DIETZ N LEWERENZ HJ
Citation: N. Dietz et Hj. Lewerenz, AN OPTICAL INSITU METHOD FOR LAYER GROWTH-CHARACTERIZATION, Applied surface science, 69(1-4), 1993, pp. 350-354
DEFECT IDENTIFICATION IN SEMICONDUCTORS BY BREWSTER-ANGLE SPECTROSCOPY
Authors: LEWERENZ HJ DIETZ N
Citation: Hj. Lewerenz et N. Dietz, DEFECT IDENTIFICATION IN SEMICONDUCTORS BY BREWSTER-ANGLE SPECTROSCOPY, Journal of applied physics, 73(10), 1993, pp. 4975-4987
Risultati: 1-25 | 26-28 |