Authors: ZALKIND S PELLAG J ZEVIN L DITCHEK BM

Citation: S. Zalkind et al., IN-SITU X-RAY-DIFFRACTION MEASUREMENTS OF SILICIDE FORMATION IN THE CO-SI SYSTEM, Thin solid films, 249(2), 1994, pp. 187-194

Authors: PELLEG J ZALKIND S ZEVIN L DITCHEK BM

Citation: J. Pelleg et al., SILICIDE FORMATION IN THE CO-SI SYSTEM BY RAPID THERMAL ANNEALING, Thin solid films, 249(1), 1994, pp. 126-131