Authors: DJAMDJI F GORVIN AC FREESTON IL TOZER RC MAYES IC BLIGHT SR

Citation: F. Djamdji et al., ELECTRICAL-IMPEDANCE TOMOGRAPHY APPLIED TO SEMICONDUCTOR WAFER CHARACTERIZATION, Measurement science & technology, 7(3), 1996, pp. 391-395

Authors: DJAMDJI F BLUNT R

Citation: F. Djamdji et R. Blunt, HALL-MOBILITY PROFILING IN HIGH-ELECTRON-MOBILITY TRANSISTOR STRUCTURES, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 77-81