Authors: DONNELLY DW COVINGTON BC GRUN J HOFFMAN CA MEYER JR MANKA CK GLEMBOCKI O QADRI SB SKELTON EF

Citation: Dw. Donnelly et al., FAR-INFRARED SPECTROSCOPIC, MAGNETOTRANSPORT, AND X-RAY STUDY OF ATHERMAL ANNEALING IN NEUTRON-TRANSMUTATION-DOPED SILICON, Applied physics letters, 71(5), 1997, pp. 680-682