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Authors: SENEMAUD C DRISSKHODJA M GHEORGHIU A HAREL S DUFOUR G ROULET H

Citation: C. Senemaud et al., ELECTRONIC-STRUCTURE OF SILICON-NITRIDE STUDIED BY BOTH SOFT-X-RAY SPECTROSCOPY AND PHOTOELECTRON-SPECTROSCOPY, Journal of applied physics, 74(8), 1993, pp. 5042-5046