Authors:
VERGA A
BAGLIONI P
DUPONT O
DEWANDEL JL
BEUSELINCK T
BOUWEN J
Citation: A. Verga et al., USE OF ELECTRONIC SPECKLE PATTERN INTERFEROMETERS FOR THE ANALYSIS OFCONVECTIVE STATES OF LIQUIDS IN WEIGHTLESSNESS, Optical engineering, 37(7), 1998, pp. 2162-2174
Citation: O. Dupont et al., ADAPTATION OF THE RIETVELD METHOD FOR THE CHARACTERIZATION OF THE LAMELLAR MICROSTRUCTURE OF POLYMERS, Journal of applied crystallography, 30, 1997, pp. 921-931
Citation: O. Dupont et al., USE OF ELECTRONIC SPECKLE PATTERN INTERFEROMETRY FOR TEMPERATURE DISTRIBUTION MEASUREMENTS THROUGH LIQUIDS, Optics letters, 20(17), 1995, pp. 1824-1826
Citation: B. Chervy et al., THE INFLUENCE OF THE CROSS-SECTION OF THE ELECTRON-COPPER ATOM COLLISION ON THE ELECTRICAL-CONDUCTIVITY OF AR-CU AND SF6-CU PLASMAS, Journal of physics. D, Applied physics, 28(10), 1995, pp. 2060-2066