Authors: DWIVEDI D DWIVEDI R SRIVASTAVA SK

Citation: D. Dwivedi et al., THE EFFECT OF HYDROGEN-INDUCED INTERFACE TRAPS ON A TITANIUM DIOXIDE-BASED PALLADIUM GATE MO CAPACITOR (PD-MOSC) - A CONDUCTANCE STUDY, Microelectronics, 29(7), 1998, pp. 445-450