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Results: 2

Authors: Ronning, C Dalmer, M Uhrmacher, M Restle, M Vetter, U Ziegeler, L Hofsass, H Gehrke, T Jarrendahl, K Davis, RF
Citation: C. Ronning et al., Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery, J APPL PHYS, 87(5), 2000, pp. 2149-2157

Authors: Dalmer, M Vetter, U Restle, M Stotzler, A Hofsass, H Ronning, C Moodley, MK Bharuth-Ram, K
Citation: M. Dalmer et al., Combination of emission channeling, photoluminescence and Mossbauer spectroscopy to identify rare earth defect complexes in semiconductors, HYPER INTER, 121(1-8), 1999, pp. 347-352
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