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Results:
1-7
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Results: 7
Authors:
De Braekeleer, K
Torres-Lapasio, JR
Massart, DL
Citation: K. De Braekeleer et al., Improved purity assessment of high-performance liquid chromatography diodearray detection data for overcoming the presence of the non-linearity artefact, CHEM INTELL, 52(1), 2000, pp. 45-59
Authors:
De Braekeleer, K
de Juan, A
Sanchez, FC
Hailey, PA
Sharp, DCA
Dunn, P
Massart, DL
Citation: K. De Braekeleer et al., Determination of the end point of a chemical synthesis process using on-line measured mid-infrared spectra, APPL SPECTR, 54(4), 2000, pp. 601-607
Authors:
Frenich, AG
Galera, MM
Vidal, JLM
Massart, DL
Torres-Lapasio, JR
De Braekeleer, K
Wang, JH
Hopke, PK
Citation: Ag. Frenich et al., Resolution of multicomponent peaks by orthogonal projection approach, positive matrix factorization and alternating least squares, ANALYT CHIM, 411(1-2), 2000, pp. 145-155
Authors:
Frenich, AG
Torres-Lapasio, JR
De Braekeleer, K
Massart, DL
Vidal, JLM
Galera, MM
Citation: Ag. Frenich et al., Application of several modified peak purity assays to real complex multicomponent mixtures by high-performance liquid chromatography with diode-arraydetection, J CHROMAT A, 855(2), 1999, pp. 487-499
Authors:
De Braekeleer, K
de Juan, A
Massart, DL
Citation: K. De Braekeleer et al., Purity assessment and resolution of tetracycline hydrochloride samples analysed using high-performance liquid chromatography with diode array detection, J CHROMAT A, 832(1-2), 1999, pp. 67-86
Authors:
Vander Heyden, Y
De Braekeleer, K
Zhu, Y
Roets, E
Hoogmartens, J
De Beer, J
Massart, DL
Citation: Y. Vander Heyden et al., Nested designs in ruggedness testing, J PHARM B, 20(6), 1999, pp. 875-887
Authors:
De Braekeleer, K
De Maesschalck, R
Hailey, PA
Sharp, DCA
Massart, DL
Citation: K. De Braekeleer et al., On-line application of the orthogonal projection approach (OPA) and the soft independent modelling of class analogy approach (SIMCA) for the detection of the end point of a polymorph conversion reaction by near infrared spectroscopy (NIR), CHEM INTELL, 46(2), 1999, pp. 103-116
Risultati:
1-7
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