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Results:
1-12
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Results: 12
Authors:
Gerardi, C
Giannini, C
De Caro, L
Tapfer, L
Rouillard, Y
Jenichen, B
Daweritz, L
Ploog, KH
Citation: C. Gerardi et al., Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb-AlGaSb heterostructures grown by molecular beam epitaxy, J VAC SCI B, 19(3), 2001, pp. 836-842
Authors:
Giannini, C
De Caro, L
Lagomarsino, S
Cedola, A
Di Fonzo, S
Jark, W
Citation: C. Giannini et al., X-ray waveguide as a new tool for 100 nm spatially resolved x-ray strain analysis, J PHYS D, 34(10A), 2001, pp. A40-A43
Authors:
De Caro, L
Giannini, C
De Riccardis, MF
Nacucchi, M
Tapfer, L
Hey, R
Daweritz, L
Ploog, KH
Citation: L. De Caro et al., Chemical composition of InxGa1-xAs epilayers grown simultaneously on differently oriented GaAs substrates, J CRYST GR, 223(4), 2001, pp. 494-502
Authors:
De Caro, L
Giannini, C
Tapfer, L
Balestrino, G
Medaglia, PG
Petrocelli, G
Citation: L. De Caro et al., Structure refinement of infinite-layer superlattices, PHIL MAG B, 80(5), 2000, pp. 1047-1053
Authors:
Lagomarsino, S
Di Fonzo, S
Jark, W
Giannini, C
De Caro, L
Cedola, A
Citation: S. Lagomarsino et al., X-ray nano-diffraction: 100 nm resolution obtained in a novel imaging technique for strain measurement at buried interfaces, MICROEL ENG, 53(1-4), 2000, pp. 645-648
Authors:
Di Fonzo, S
Jark, W
Lagomarsino, S
Giannini, C
De Caro, L
Cedola, A
Muller, M
Citation: S. Di Fonzo et al., Non-destructive determination of local strain with 100-nanometre spatial resolution, NATURE, 403(6770), 2000, pp. 638-640
Authors:
Tagliente, MA
De Caro, L
Sacchetti, A
Tapfer, L
Balestrino, G
Medaglia, PG
Tebano, A
Tucciarone, A
Citation: Ma. Tagliente et al., X-ray characterization of LiNbO3 films grown by pulsed laser deposition onSrTiO3(100), NdGaO3(110) and MgO(111) substrates, J CRYST GR, 216(1-4), 2000, pp. 335-342
Authors:
Lomascolo, M
Rinaldi, R
Passaseo, A
De Vittorio, M
De Giorgi, M
Cingolani, R
De Caro, L
Tapfer, L
Taurino, A
Catalano, M
Citation: M. Lomascolo et al., Time resolved screening of the piezoelectric field in InGaAs/GaAs V-shapedquantum wires of variable profile, J PHYS-COND, 11(31), 1999, pp. 5989-5997
Authors:
De Caro, L
Giannini, C
Nacucchi, M
Tapfer, L
Balestrino, G
Medaglia, PG
Petrocelli, G
Citation: L. De Caro et al., Structure refinement of Ba-based infinite-layer superlattices, PHYS REV B, 59(21), 1999, pp. 14074-14079
Authors:
De Caro, L
Ferrara, MC
Citation: L. De Caro et Mc. Ferrara, Simple method for the determination of optical parameters of inhomogeneousthin films, THIN SOL FI, 342(1-2), 1999, pp. 153-159
Authors:
Rouillard, Y
Jenichen, B
Daweritz, L
Ploog, K
Gerardi, C
Giannini, C
De Caro, L
Tapfer, L
Citation: Y. Rouillard et al., MBE growth and characterisation of Al(x)Ga(1-x)Sblayers on GaSb substrates, J CRYST GR, 204(3), 1999, pp. 263-269
Authors:
De Caro, L
Tapfer, L
Citation: L. De Caro et L. Tapfer, Strain determination in epitaxic films of materials of orthorhombic symmetry by high resolution X-ray diffraction, J APPL CRYS, 31, 1998, pp. 831-834
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