AAAAAA
Results: 1-25/71
Authors:
De Hosson, JTM
Roos, A
Metselaar, ED
Citation: Jtm. De Hosson et al., Temperature rise due to fast-moving dislocations, PHIL MAG A, 81(5), 2001, pp. 1099-1120
Authors:
Carvalho, PA
De Hosson, JTM
Citation: Pa. Carvalho et Jtm. De Hosson, Stacking faults in the Co7W6 isomorph of the mu phase, SCR MATER, 45(3), 2001, pp. 333-340
Authors:
Vriesendorp, W
Kooi, BJ
De Hosson, JTM
Citation: W. Vriesendorp et al., Antimony segregation at copper/manganese-oxide interfaces studied with analytical transmission electron microscopy, SCR MATER, 45(2), 2001, pp. 169-175
Authors:
Kooi, BJ
Vystavel, T
De Hosson, JTM
Citation: Bj. Kooi et al., Microstructure and properties of giant magneto-resistant Au80Co20, Au80Co10Fe10, Cu70Ni25Fe4Mn and Cu53Ni31Fe15Mn, SCR MATER, 44(8-9), 2001, pp. 1461-1464
Authors:
Vreeling, JA
Pei, YT
Wind, B
Ocelik, V
De Hosson, JTM
Citation: Ja. Vreeling et al., Formation of gamma-Al2O3 in reaction coatings produced with lasers, SCR MATER, 44(4), 2001, pp. 643-649
Authors:
Balke, P
De Hosson, JTM
Citation: P. Balke et Jtm. De Hosson, Orientation imaging microscopic observations of in situ deformed ultra lowcarbon steel, SCR MATER, 44(3), 2001, pp. 461-466
Authors:
de Hass, M
De Hosson, JTM
Citation: M. De Hass et Jtm. De Hosson, Grain boundary segregation and precipitation in aluminium alloys, SCR MATER, 44(2), 2001, pp. 281-286
Authors:
Kooi, BJ
De Hosson, JTM
Citation: Bj. Kooi et Jtm. De Hosson, In-situ TEM analysis of the reduction of nanometre-sized Mn3O4 precipitates in a metal matrix, ACT MATER, 49(5), 2001, pp. 765-774
Authors:
Pei, YT
De Hosson, JTM
Citation: Yt. Pei et Jtm. De Hosson, Five-fold branched Si particles in laser clad AlSi functionally graded materials, ACT MATER, 49(4), 2001, pp. 561-571
Authors:
Carvalho, P
Kooi, BJ
De Hosson, JTM
Citation: P. Carvalho et al., Identification of planar defects in D0(19) phases using high-resolution transmission electron microscopy, PHIL MAG L, 81(10), 2001, pp. 697-707
Authors:
Roos, A
De Hosson, JTM
Van der Giessen, E
Citation: A. Roos et al., A two-dimensional computational methodology for high-speed dislocations inhigh strain-rate deformation, COMP MAT SC, 20(1), 2001, pp. 1-18
Authors:
Roos, A
De Hosson, JTM
Van der Giessen, E
Citation: A. Roos et al., High-speed dislocations in high strain-rate deformations, COMP MAT SC, 20(1), 2001, pp. 19-27
Authors:
Wang, YG
Yan, GH
De Hosson, JTM
Citation: Yg. Wang et al., Determination of the Sigma 21 [211] orientational relationship in a MgO/Cucomposite, MAT SCI E A, 316(1-2), 2001, pp. 87-92
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Influence of quasi-layer-by-layer roughness on proximity effects in thin film superconducting/normal-metal junctions, PHYSICA C, 355(3-4), 2001, pp. 211-216
Authors:
Carvalho, NJM
De Hosson, JTM
Citation: Njm. Carvalho et Jtm. De Hosson, Characterization of mechanical properties of tungsten carbide/carbon multilayers: Cross-sectional electron microscopy and nanoindentation observations, J MATER RES, 16(8), 2001, pp. 2213-2222
Authors:
Palasantzas, G
van Agterveld, DTL
Koch, SA
De Hosson, JTM
Citation: G. Palasantzas et al., Influence of electron flux on the oxidation of Ni3Al surfaces, J VAC SCI A, 19(5), 2001, pp. 2581-2585
Authors:
Sebastian, JT
Rusing, J
Hellman, OC
Seidman, DN
Vriesendorp, W
Kooi, BJ
De Hosson, JTM
Citation: Jt. Sebastian et al., Subnanometer three-dimensional atom-probe investigation of segregation at MgO/Cu ceramic/metal heterophase interfaces, ULTRAMICROS, 89(1-3), 2001, pp. 203-213
Authors:
Carvalho, NJM
De Hosson, JTM
Citation: Njm. Carvalho et Jtm. De Hosson, Nanoindentation study of PVD WC/C coatings supported by cross-sectional electron microscopy observations, SURF ENG, 17(2), 2001, pp. 105-111
Authors:
Zoestbergen, E
Carvalho, NJM
De Hosson, JTM
Citation: E. Zoestbergen et al., Stress state or TiN/TiAlN PVD multilayers, SURF ENG, 17(1), 2001, pp. 29-34
Authors:
Wang, YG
De Hosson, JTM
Citation: Yg. Wang et Jtm. De Hosson, Secondary interface dislocations in internally oxidized MgO/Cu composite, J MAT SCI L, 20(5), 2001, pp. 389-392
Authors:
Palasantzas, G
Zhao, YP
Wang, GC
Lu, TM
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Electrical conductivity and thin film growth dynamics (vol B 61, pg 11 109, 2000) - art. no. 079903, PHYS REV B, 6407(7), 2001, pp. 9903-9903
Authors:
Chung, JW
De Hosson, JTM
van der Giessen, E
Citation: Jw. Chung et al., Failure stress of a disordered three-dimensional spring network - art. no.064202, PHYS REV B, 6406(6), 2001, pp. 4202
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode (vol B 63, art. no. 125404, 2001) - art. no. 239901, PHYS REV B, 6323(23), 2001, pp. 9901-9901
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode - art. no. 125404, PHYS REV B, 6312(12), 2001, pp. 5404
Authors:
De Hosson, JTM
Kooi, BJ
Citation: Jtm. De Hosson et Bj. Kooi, Metal/ceramic interfaces: a microscopic analysis, SURF INT AN, 31(7), 2001, pp. 637-658