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Results: 1
Feasibility study on the characterization of thin layers by charged-particle activation analysis
Authors:
De Neve, K Strijckmans, K Dams, R
Citation:
K. De Neve et al., Feasibility study on the characterization of thin layers by charged-particle activation analysis, ANALYT CHEM, 72(13), 2000, pp. 2814-2820
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