AAAAAA
Results:
1-10
|
Results: 10
Authors:
Serrano, JJ
Blanco, JM
Guzman, B
De Witte, H
Vandervorst, W
Citation: Jj. Serrano et al., Steady state oxygen surface content in oxygen sputtered silicon at impact energy of 5 keV per atom, J APPL PHYS, 90(9), 2001, pp. 4456-4466
Authors:
Serrano, JJ
De Witte, H
Vandervorst, W
Guzman, B
Blanco, JM
Citation: Jj. Serrano et al., Simulation of the initial transient of the Si+ and O+ signals from oxygen sputtered silicon by means of independent models on sputtering and secondary ionization, J APPL PHYS, 89(9), 2001, pp. 5191-5198
Authors:
De Witte, H
Vandervorst, W
Gijbels, R
Citation: H. De Witte et al., Modeling of bombardment induced oxidation of silicon, J APPL PHYS, 89(5), 2001, pp. 3001-3011
Authors:
Brijs, B
Deleu, J
Conard, T
De Witte, H
Vandervorst, W
Nakajima, K
Kimura, K
Genchev, I
Bergmaier, A
Goergens, L
Neumaier, P
Dollinger, G
Dobeli, M
Citation: B. Brijs et al., Characterization of ultra thin oxynitrides: A general approach, NUCL INST B, 161, 2000, pp. 429-434
Authors:
De Witte, H
Conard, T
Vandervorst, W
Gijbels, R
Citation: H. De Witte et al., SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding, SURF INT AN, 29(11), 2000, pp. 761-765
Authors:
De Witte, H
De Gendt, S
Douglas, M
Conard, T
Kenis, K
Mertens, PW
Vandervorst, W
Gijbels, R
Citation: H. De Witte et al., Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on Si wafer surfaces, J ELCHEM SO, 147(5), 2000, pp. 1915-1919
Authors:
Venkova, T
Porquet, MG
Deloncle, I
Gall, BJP
De Witte, H
Petkov, P
Bauchet, A
Kutsarova, T
Gueorgieva, E
Duprat, J
Gautherin, C
Hoellinger, F
Lucas, R
Minkova, A
Schulz, N
Sergolle, H
Stefanova, EA
Wilson, A
Citation: T. Venkova et al., High-spin structure of the neutron-rich Rh-107,109(45) isotopes: the role of triaxiality, EUR PHY J A, 6(4), 1999, pp. 405-413
Authors:
Conard, T
Kondoh, E
De Witte, H
Maex, K
Vandervorst, W
Citation: T. Conard et al., X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface, J VAC SCI A, 17(4), 1999, pp. 1244-1249
Authors:
Conard, T
De Witte, H
Loo, R
Verheyen, P
Vandervorst, W
Caymax, M
Gijbels, R
Citation: T. Conard et al., XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers, THIN SOL FI, 344, 1999, pp. 583-586
Authors:
Grebenschikov, N
Sweep, F
Geurts, A
Andreasen, P
De Witte, H
Schousboe, S
Heuvel, J
Benraad, T
Citation: N. Grebenschikov et al., ELISA for complexes of urokinase-type and tissue-type plasminogen activators with their type-1 inhibitor (uPA similar to PAI-1 and tPA similar to PAI-1), INT J CANC, 81(4), 1999, pp. 598-606
Risultati:
1-10
|