Authors:
Golan, G
Rabinovich, E
Inberg, A
Axelevitch, A
Lubarsky, G
Rancoita, PG
Demarchi, M
Seidman, A
Croitoru, N
Citation: G. Golan et al., Inversion phenomenon as a result of junction damages in neutron irradiatedsilicon detectors, MICROEL REL, 41(1), 2001, pp. 67-72