Authors: Detalle, V Heon, R Sabsabi, M St-Onge, L

Citation: V. Detalle et al., An evaluation of a commercial Echelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy, SPECT ACT B, 56(6), 2001, pp. 1011-1025

Authors: Detalle, V Lacour, JL Mauchien, P Semerok, A

Citation: V. Detalle et al., Investigation of laser plasma for solid element composition microanalysis, APPL SURF S, 139, 1999, pp. 299-301

Authors: Salle, B Chaleard, C Detalle, V Lacour, JL Mauchien, P Nouvellon, C Semerok, A

Citation: B. Salle et al., Laser ablation efficiency of metal samples with UV laser nanosecond pulses, APPL SURF S, 139, 1999, pp. 302-305

Authors: Semerok, A Chaleard, C Detalle, V Lacour, JL Mauchien, P Meynadier, P Nouvellon, C Salle, B Palianov, P Perdrix, M Petite, G

Citation: A. Semerok et al., Experimental investigations of laser ablation efficiency of pure metals with femto, pico and nanosecond pulses, APPL SURF S, 139, 1999, pp. 311-314