Citation: V. Detalle et al., An evaluation of a commercial Echelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy, SPECT ACT B, 56(6), 2001, pp. 1011-1025
Authors:
Semerok, A
Chaleard, C
Detalle, V
Lacour, JL
Mauchien, P
Meynadier, P
Nouvellon, C
Salle, B
Palianov, P
Perdrix, M
Petite, G
Citation: A. Semerok et al., Experimental investigations of laser ablation efficiency of pure metals with femto, pico and nanosecond pulses, APPL SURF S, 139, 1999, pp. 311-314