Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-1
|
Results: 1
The behavior of Ni/Au contacts under rapid thermal annealing in GaN devicestructures
Authors:
Huet, F Di Forte-Poisson, MA Calligaro, M Olivier, J Wyczisk, F Di Persio, J
Citation:
F. Huet et al., The behavior of Ni/Au contacts under rapid thermal annealing in GaN devicestructures, J ELEC MAT, 28(12), 1999, pp. 1440-1443
Risultati:
1-1
|