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Citation: Sc. Binari et al., Trapping effects and microwave power performance in AlGaN/GaN HEMTs, IEEE DEVICE, 48(3), 2001, pp. 465-471

Authors: Dietrich, HB Kang, JU Frankel, MY

Citation: Hb. Dietrich et al., Implantation approach to SEU suppression in GaAs, ELECTR LETT, 35(9), 1999, pp. 751-752