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Results: 1-11 |
Results: 11

Authors: Dietz, N
Citation: N. Dietz, Real-time optical characterization of thin film growth, MAT SCI E B, 87(1), 2001, pp. 1-22

Authors: Dietz, N Beeler, SC Schmidt, JW Tran, HT
Citation: N. Dietz et al., Surface reaction kinetics of Ga1-xInxP growth during pulsed chemical beam epitaxy, APPL SURF S, 178(1-4), 2001, pp. 63-74

Authors: Dimmock, JO Madarasz, FL Dietz, N Bachmann, KJ
Citation: Jo. Dimmock et al., Theoretical analysis of phase-matched second-harmonic generation and optical parametric oscillation in birefringent semiconductor waveguides, APPL OPTICS, 40(9), 2001, pp. 1438-1441

Authors: Narayanan, V Mahajan, S Sukidi, N Bachmann, KJ Woods, V Dietz, N
Citation: V. Narayanan et al., Orientation mediated self-assembled gallium phosphide islands grown on silicon, PHIL MAG A, 80(3), 2000, pp. 555-572

Authors: Woods, V Dietz, N Ito, K Lauko, I
Citation: V. Woods et al., Real-time thickness and compositional control of Ga1-xInxP growth using p-polarized reflectance, J VAC SCI A, 18(4), 2000, pp. 1190-1195

Authors: Burguera, B Proctor, D Dietz, N Guo, ZK Joyner, M Jensen, MD
Citation: B. Burguera et al., Leg free fatty acid kinetics during exercise in men and women, AM J P-ENDO, 278(1), 2000, pp. E113-E117

Authors: Madarasz, FL Dimmock, JO Dietz, N Bachmann, KJ
Citation: Fl. Madarasz et al., Sellmeier parameters for ZnGaP2 and GaP, J APPL PHYS, 87(3), 2000, pp. 1564-1565

Authors: Madarasz, FL Dimmock, JO Dietz, N Bachmann, KJ
Citation: Fl. Madarasz et al., Sellmeier parameters for ZnGaP2 and GaP (vol 87, pg 1564, 2000), J APPL PHYS, 87(10), 2000, pp. 7597-7597

Authors: Dietz, N Woods, V Ito, K Lauko, I
Citation: N. Dietz et al., Real-time optical control of Ga1-xInxP film growth by p-polarized reflectance, J VAC SCI A, 17(4), 1999, pp. 1300-1306

Authors: Hay, M Mckenzie, H Lindsley, K Dietz, N Bradley, SR Conn, PJ Hasser, EM
Citation: M. Hay et al., Heterogeneity of metabotropic glutamate receptors in autonomic cell groupsof the medulla oblongata of the rat, J COMP NEUR, 403(4), 1999, pp. 486-501

Authors: Beeler, S Tran, HT Dietz, N
Citation: S. Beeler et al., Representation of GaP formation by a reduced order surface kinetics model using p-polarized reflectance measurements, J APPL PHYS, 86(1), 1999, pp. 674-682
Risultati: 1-11 |