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Results:
1-3
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Results: 3
The effect of oxygen in the annealing ambient on interfacial reactions of Cu/Ta/Si multilayers
Authors:
Yin, KM Chang, L Chen, FR Kai, JJ Chiang, CC Ding, PJ Chin, B Zhang, H Chen, FS
Citation:
Km. Yin et al., The effect of oxygen in the annealing ambient on interfacial reactions of Cu/Ta/Si multilayers, THIN SOL FI, 388(1-2), 2001, pp. 15-21
Oxidation of Ta diffusion barrier layer for Cu metallization in thermal annealing
Authors:
Yin, KM Chang, L Chen, FR Kai, JJ Chiang, CC Chuang, G Ding, PJ Chin, B Zhang, H Chen, FS
Citation:
Km. Yin et al., Oxidation of Ta diffusion barrier layer for Cu metallization in thermal annealing, THIN SOL FI, 388(1-2), 2001, pp. 27-33
Deposition of copper by using self-sputtering
Authors:
Fu, JM Ding, PJ Dorleans, F Xu, Z Chen, FS
Citation:
Jm. Fu et al., Deposition of copper by using self-sputtering, J VAC SCI A, 17(5), 1999, pp. 2830-2834
Risultati:
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