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Citation: Cv. Macchioni et al., Resistance as a reliability indicator in lifetime testing of thin film magnetic recording heads, J APPL PHYS, 87(9), 2000, pp. 5395-5397

Authors: Doan, VV Chang, CL Lam, CF Thompson, J

Citation: Vv. Doan et al., Reliability characteristics of IrMn dual synthetic spin valves, IEEE MAGNET, 36(5), 2000, pp. 2608-2610