Authors: Dombrowski, KF Dietrich, B De Wolf, I Rooyackers, R Badenes, G

Citation: Kf. Dombrowski et al., Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy, MICROEL REL, 41(4), 2001, pp. 511-515

Authors: Dietrich, B Dombrowski, KF

Citation: B. Dietrich et Kf. Dombrowski, Experimental challenges of stress measurements with resonant micro-Raman spectroscopy, J RAMAN SP, 30(10), 1999, pp. 893-897

Authors: Franz, M Dombrowski, KF Rucker, H Dietrich, B Pressel, K Barz, A Kerat, U Dold, P Benz, KW

Citation: M. Franz et al., Phonons in Ge1-xSix bulk crystals, PHYS REV B, 59(16), 1999, pp. 10614-10621

Authors: Bhagavannarayana, G Dietrich, B Zaumseil, P Dombrowski, KF

Citation: G. Bhagavannarayana et al., Determination of germanium content and relaxation in Si1-xGex/Si layers byRaman spectroscopy and X-ray diffractometry, PHYS ST S-A, 172(2), 1999, pp. 425-432

Authors: Dombrowski, KF De Wolf, I Dietrich, B

Citation: Kf. Dombrowski et al., Stress measurements using ultraviolet micro-Raman spectroscopy, APPL PHYS L, 75(16), 1999, pp. 2450-2451