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Results: 3

Authors: Bush, RW Donald, JK Bucci, RJ
Citation: Rw. Bush et al., Pitfalls to avoid in threshold testing and its interpretation, AM SOC TEST, 1372, 2000, pp. 269-284

Authors: Paris, PC Tada, H Donald, JK
Citation: Pc. Paris et al., Service load fatigue damage - a historical perspective, INT J FATIG, 21, 1999, pp. S35-S46

Authors: Sheldon, JW Bain, KR Donald, JK
Citation: Jw. Sheldon et al., Investigation of the effects of shed-rate, initial K-max, and geometric constraint on Delta K-th in Ti-6Al-4V at room temperature, INT J FATIG, 21(7), 1999, pp. 733-741
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