Citation: T. Drobek et al., Determination of shear stiffness based on thermal noise analysis in atomicforce microscopy: Passive overtone microscopy - art. no. 045401, PHYS REV B, 6404(4), 2001, pp. 5401
Citation: T. Drobek et Wm. Heckl, Scanning probe microscopy studies of the surface of decagonal quasicrystals in ambient conditions, MAT SCI E A, 294, 2000, pp. 878-881