Authors: Dupuy, JC

Citation: Jc. Dupuy, SIMS analysis in thin semiconductor films, VIDE, 54(292), 1999, pp. 160

Authors: Gautier, B Prudon, G Dupuy, JC

Citation: B. Gautier et al., Toward a better reliability in the deconvolution of SIMS depth profiles, SURF INT AN, 26(13), 1998, pp. 974-983