Authors:
Buchner, S
Campbell, AB
Meehan, T
Clark, KA
McMorrow, D
Dyer, C
Sanderson, C
Comber, C
Kuboyama, S
Citation: S. Buchner et al., Investigation of single-ion multiple-bit upsets in memories on board a space experiment, IEEE NUCL S, 47(3), 2000, pp. 705-711