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Results: 3
TUNGSTEN CHEMICAL-MECHANICAL POLISHING
Authors:
ELBEL N NEUREITHER B EBERSBERGER B LAHNOR P
Citation:
N. Elbel et al., TUNGSTEN CHEMICAL-MECHANICAL POLISHING, Journal of the Electrochemical Society, 145(5), 1998, pp. 1659-1664
CONDUCTING ATOMIC-FORCE MICROSCOPY FOR NANOSCALE ELECTRICAL CHARACTERIZATION OF THIN SIO2
Authors:
OLBRICH A EBERSBERGER B BOIT C
Citation:
A. Olbrich et al., CONDUCTING ATOMIC-FORCE MICROSCOPY FOR NANOSCALE ELECTRICAL CHARACTERIZATION OF THIN SIO2, Applied physics letters, 73(21), 1998, pp. 3114-3116
EQUILIBRIUM DEFECT DENSITY IN HYDROGENATED AMORPHOUS-GERMANIUM
Authors:
EBERSBERGER B KRUHLER W FUHS W MELL H
Citation:
B. Ebersberger et al., EQUILIBRIUM DEFECT DENSITY IN HYDROGENATED AMORPHOUS-GERMANIUM, Applied physics letters, 65(13), 1994, pp. 1683-1685
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