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Results:
1-13
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Results: 13
Authors:
DAHLHAUS R
EICHLER M
SANDKUHLER J
Citation: R. Dahlhaus et al., IDENTIFICATION OF SYNAPTIC CONNECTIONS IN NEURAL ENSEMBLES BY GRAPHICAL MODELS, Journal of neuroscience methods, 77(1), 1997, pp. 93-107
Authors:
EICHLER M
Citation: M. Eichler, A RIDE COMFORT TYRE MODEL FOR VIBRATION ANALYSIS IN FULL VEHICLE SIMULATIONS, Vehicle System Dynamics, 27, 1997, pp. 109-122
Authors:
REUL H
EICHLER M
POTTHAST K
SCHMITZ C
RAU G
Citation: H. Reul et al., IN-VITRO TESTING OF HEART-VALVE WEAR OUTSIDE OF THE MANUFACTURERS LABORATORY - REQUIREMENTS AND CONTROVERSIES, Journal of heart valve disease, 5, 1996, pp. 97-103
Authors:
BIRTH M
CARROLL BJ
DELINIKOLAS K
EICHLER M
WEISER HF
Citation: M. Birth et al., RECOGNITION OF LAPAROSCOPIC BILE-DUCT INJURIES BY INTRAOPERATIVE ULTRASONOGRAPHY, Surgical endoscopy, 10(8), 1996, pp. 794-797
Authors:
FISCHER A
KUHNE H
EICHLER M
HOLLANDER F
RICHTER H
Citation: A. Fischer et al., STRAIN AND SURFACE PHENOMENA IN SIGE STRUCTURES, Physical review. B, Condensed matter, 54(12), 1996, pp. 8761-8768
Authors:
EICHLER M
Citation: M. Eichler, THE CONSTRUCTION OF TECHNOLOGICALLY-MEDIATED FAMILIES, Journal of comparative family studies, 27(2), 1996, pp. 281
Authors:
KISSINGER W
OSTEN HJ
WEIDNER M
EICHLER M
Citation: W. Kissinger et al., CRITICAL-POINTS OF SI1-YCY AND SI1-X-YGEXCY LAYERS STRAINED PSEUDOMORPHICALLY ON SI(001), Journal of applied physics, 79(6), 1996, pp. 3016-3020
Authors:
SHOSHANY M
KUTIEL P
LAVEE H
EICHLER M
Citation: M. Shoshany et al., REMOTE-SENSING OF VEGETATION COVER ALONG A CLIMATOLOGICAL GRADIENT, ISPRS journal of photogrammetry and remote sensing, 49(4), 1994, pp. 2-10
Authors:
KISSINGER W
WEIDNER M
OSTEN HJ
EICHLER M
Citation: W. Kissinger et al., OPTICAL-TRANSITIONS IN STRAINED SI1-YCY LAYERS ON SI(001), Applied physics letters, 65(26), 1994, pp. 3356-3358
Authors:
EICHLER M
Citation: M. Eichler, PRIVATE LIVES, PUBLIC-POLICY - 100 YEARS OF STATE INTERVENTION IN THEFAMILY - URSEL,J, Canadian public policy, 19(3), 1993, pp. 344-345
Authors:
WEIDNER M
ROSELER A
EICHLER M
Citation: M. Weidner et al., IR ELLIPSOMETRY INVESTIGATIONS OF N2O-NITRIDED SILICON-OXIDE THIN-FILMS ON SILICON, Thin solid films, 234(1-2), 1993, pp. 337-341
Authors:
WEIDNER M
ZAUMSEIL P
EICHLER M
Citation: M. Weidner et al., DETERMINATION OF THICKNESS AND GE CONTENT OF STRAINED SI1-XGEX LAYERSON SI SUBSTRATE BY 2-WAVELENGTH ELLIPSOMETRY, Physica status solidi. a, Applied research, 136(1), 1993, pp. 131-138
Authors:
EICHLER M
Citation: M. Eichler, KINETICS OF NONHOMOGENEOUS PROCESSES IN HUMAN-SOCIETY - UNETHICAL BEHAVIOR AND SOCIETAL CHAOS - COMMENT, Canadian journal of physics, 71(3-4), 1993, pp. 186-190
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1-13
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