Authors:
ILO A
PFUTZNER H
BANGERT H
EISENMENGERSITTNER C
Citation: A. Ilo et al., SPUTTERED SEARCH COILS FOR FLUX DISTRIBUTION ANALYSES IN LAMINATED MAGNETIC CORES, Journal de physique. IV, 8(P2), 1998, pp. 733-736
Authors:
EISENMENGERSITTNER C
BANGERT H
BERGAUER A
Citation: C. Eisenmengersittner et al., KINETIC PHASE-SEPARATION IN SPUTTER-DEPOSITED ALUMINUM-TIN FILMS, Journal of crystal growth, 186(1-2), 1998, pp. 151-165
Authors:
BANGERT H
EISENMENGERSITTNER C
BERGAUER A
Citation: H. Bangert et al., DEPOSITION AND STRUCTURAL-PROPERTIES OF 2-COMPONENT METAL COATINGS FOR TRIBOLOGICAL APPLICATIONS, Surface & coatings technology, 80(1-2), 1996, pp. 162-170
Authors:
BAUER W
BETZ G
BANGERT H
BERGAUER A
EISENMENGERSITTNER C
Citation: W. Bauer et al., MONTE-CARLO SIMULATION OF THE VARIATION OF A BINARY ALLOY FILM COMPOSITION DUE TO INTRINSIC RESPUTTERING USING DIFFERENT WORKING GASES, Thin solid films, 282(1-2), 1996, pp. 68-72
Authors:
EISENMENGERSITTNER C
BEYERKNECHT R
BERGAUER A
BAUER W
BETZ G
Citation: C. Eisenmengersittner et al., ANGULAR-DISTRIBUTION OF SPUTTERED NEUTRALS IN A POST MAGNETRON GEOMETRY - MEASUREMENT AND MONTE-CARLO SIMULATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(5), 1995, pp. 2435-2443
Authors:
EISENMENGERSITTNER C
BERGAUER A
BANGERT H
BAUER W
Citation: C. Eisenmengersittner et al., THE GROWTH DYNAMICS OF THICK SPUTTERED COPPER COATINGS UNDER THE INFLUENCE OF SURFACE-DIFFUSION - A QUANTITATIVE ATOMIC-FORCE MICROSCOPY STUDY, Journal of applied physics, 78(8), 1995, pp. 4899-4905
Authors:
BAUER W
BETZ G
BANGERT H
BERGAUER A
EISENMENGERSITTNER C
Citation: W. Bauer et al., INTRINSIC RESPUTTERING DURING FILM DEPOSITION INVESTIGATED BY MONTE-CARLO SIMULATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(6), 1994, pp. 3157-3164
Authors:
EISENMENGERSITTNER C
BERGAUER A
BANGERT H
BAUER W
Citation: C. Eisenmengersittner et al., MEASUREMENT OF THE ANGULAR-DISTRIBUTION OF SPUTTERED NEUTRALS IN A PLANAR MAGNETRON GEOMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 536-541