Authors: ELST K ADRIAENS A ADAMS F

Citation: K. Elst et al., THE STUDY OF RIPPLE FORMATION AND DEGRADATION OF DEPTH RESOLUTION IN GAAS AND ALXGA1-XAS STRUCTURES, International journal of mass spectrometry and ion processes, 171(1-3), 1997, pp. 191-202

Authors: ELST K VANDERVORST W

Citation: K. Elst et W. Vandervorst, INFLUENCE OF THE COMPOSITION OF THE ALTERED LAYER ON THE RIPPLE FORMATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(6), 1994, pp. 3205-3216

Authors: ELST K VANDERVORST W ALAY J SNAUWAERT J HELLEMANS L

Citation: K. Elst et al., INFLUENCE OF OXYGEN ON THE FORMATION OF RIPPLES ON SI, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 1968-1981

Authors: ELST K VANDERVORST W

Citation: K. Elst et W. Vandervorst, THE INFLUENCE OF OXYGEN ON THE ANALYSIS OF A PT SI STRUCTURE WITH SECONDARY-ION MASS-SPECTROMETRY/, Journal of applied physics, 73(9), 1993, pp. 4649-4659