Authors: ESTABIL JJ KEEFER M

Citation: Jj. Estabil et M. Keefer, A COMBINED SPECTROSCOPIC ELLIPSOMETER AND SPECTROPHOTOMETER, Solid state technology, 38(4), 1995, pp. 71-72

Authors: SIMMONS JP EIXENBERGER JA ESTABIL JJ

Citation: Jp. Simmons et al., TRENDS IN FILM THICKNESS METROLOGY, Solid state technology, 36(5), 1993, pp. 27