Citation: J. Phillips et al., Growth of HgCdTe for long-wavelength infrared detectors using automated control from spectroscopic ellipsometry measurements, J VAC SCI B, 19(4), 2001, pp. 1580-1584
Citation: D. Edwall et al., Composition control of long wavelength MBE HgCdTe using in-situ spectroscopic ellipsometry, J ELEC MAT, 30(6), 2001, pp. 643-646