Authors: Muramatsu, H Egawa, A Homma, K Kim, JM Takahashi, H Shirakawabe, Y Shimizu, N

Citation: H. Muramatsu et al., Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever, J MICROSC O, 202, 2001, pp. 154-161

Authors: Egawa, A Chiba, N Homma, K Chinone, K Muramatsu, H

Citation: A. Egawa et al., High-speed scanning by dual feedback control in SNOM AFM, J MICROSC O, 194, 1999, pp. 325-328

Authors: Muramatsu, H Homma, K Chiba, N Yamamoto, N Egawa, A

Citation: H. Muramatsu et al., Dynamic etching method for fabricating a variety of tip shapes in the optical fibre probe of a scanning near-field optical microscope, J MICROSC O, 194, 1999, pp. 383-387

Authors: Choi, KJ Kim, YH Chang, SM Egawa, A Muramatsu, H

Citation: Kj. Choi et al., Characterization of aluminum corrosion with a quartz crystal analyzer, ANALYT CHIM, 386(3), 1999, pp. 229-236