Authors:
Heyroth, F
Zellner, J
Hoche, HR
Eisenschmidt, C
Weckert, E
Drakopoulous, M
Citation: F. Heyroth et al., Pinhole topography in the three-beam case of x-ray diffraction - experiment and theory, J PHYS D, 34(10A), 2001, pp. A151-A157
Citation: E. Heyroth et al., Contrast in X-ray section topographs of perfect silicon crystals using theLaue-Laue three-beam case of diffraction, J APPL CRYS, 32, 1999, pp. 489-496