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Citation: A. El-hdiy et D. Ziane, Electric bidirectional stress effects on metal-oxide-silicon capacitors, J APPL PHYS, 89(2), 2001, pp. 1405-1410

Authors: Ziane, D El-Hdiy, A

Citation: D. Ziane et A. El-hdiy, Positive charge instability during bidirectional stress on metal-oxide-silicon capacitors, J APPL PHYS, 88(11), 2000, pp. 6589-6593

Authors: El-Hdiy, A Ziane, D Nebel, F Vuillaume, D Jourdain, M

Citation: A. El-hdiy et al., Dependence of interface-state generation on field polarity in metal-oxide-silicon devices of various thicknesses and technologies, J PHYS D, 32(13), 1999, pp. 1435-1442

Authors: El-Hdiy, A Ziane, D

Citation: A. El-hdiy et D. Ziane, Relaxation of positive charge during bidirectional electric stress on metal-oxide-silicon capacitors, J APPL PHYS, 86(11), 1999, pp. 6234-6238

Authors: Ziane, D El-Hdiy, A Salace, G

Citation: D. Ziane et al., Bidirectional stress on a p-metal-oxide-silicon capacitor, J APPL PHYS, 85(9), 1999, pp. 6593-6597