Authors: El-Sherbiny, MA El-Rehim, NSA

Citation: Ma. El-sherbiny et Nsa. El-rehim, Spectroscopic and dielectric behavior of pure and nickel-doped polyvinyl butyral films, POLYM TEST, 20(4), 2001, pp. 371-378

Authors: El-Sherbiny, MA El-Bahnasawy, HH El-Ocker, MM

Citation: Ma. El-sherbiny et al., Fluence dependence of the interband critical points in ion-implanted silicon, NUCL INST B, 168(4), 2000, pp. 510-520

Authors: Lohner, T Fried, M Khanh, NQ Petrik, P Wormeester, H El-Sherbiny, MA

Citation: T. Lohner et al., Comparative study of ion implantation caused anomalous surface damage in silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry, NUCL INST B, 147(1-4), 1999, pp. 90-95