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Results: 1-8 |
Results: 8

Authors: Zheng, YJ Ma, PF Engstrom, JR
Citation: Yj. Zheng et al., Etching by atomic hydrogen of Ge overlayers on Si(100), J APPL PHYS, 90(7), 2001, pp. 3614-3622

Authors: Schroeder, TW Ma, PF Lam, AM Zheng, YJ Engstrom, JR
Citation: Tw. Schroeder et al., Selective Si epitaxial growth technique employing atomic hydrogen and substrate temperature modulation, APPL PHYS L, 79(14), 2001, pp. 2181-2183

Authors: Lee, D Blakely, JM Schroeder, TW Engstrom, JR
Citation: D. Lee et al., A growth method for creating arrays of atomically flat mesas on silicon, APPL PHYS L, 78(10), 2001, pp. 1349-1351

Authors: Zheng, YJ Engstrom, JR Zhang, J Schellinger, A Joyce, BA
Citation: Yj. Zheng et al., The effect of coincident atomic hydrogen on the gas-source molecular beam epitaxial growth of silicon from disilane, SURF SCI, 470(1-2), 2000, pp. 131-140

Authors: Engstrom, JR Weinberg, WH
Citation: Jr. Engstrom et Wh. Weinberg, Combinatorial materials science: Paradigm shift in materials discovery andoptimization, AICHE J, 46(1), 2000, pp. 2-5

Authors: Chen, G Boyd, ID Engstrom, JR
Citation: G. Chen et al., Three dimensional modeling of silicon deposition process scale-up employing supersonic jets. II, J VAC SCI A, 17(3), 1999, pp. 978-985

Authors: Zheng, YJ Lam, AM Engstrom, JR
Citation: Yj. Zheng et al., Modeling of Ge surface segregation in vapor-phase deposited Si1-xGex thin films, APPL PHYS L, 75(6), 1999, pp. 817-819

Authors: Roadman, SE Levine, SW Zheng, YJ Clancy, P Engstrom, JR
Citation: Se. Roadman et al., Pattern formation and shadow instability in collimated energetic molecularbeam growth of silicon, APPL PHYS L, 74(1), 1999, pp. 25-27
Risultati: 1-8 |